MIL-PRF-19500/548H
4.4 Conformance inspection. Conformance inspection shall be in accordance with MIL-PRF-19500 and as
specified herein.
4.4.1 Group A inspection. Group A inspection shall be conducted in accordance with MIL-PRF-19500 and table I
herein.
4.4.1.1 Multiple device type processing and binning. The manufacturer may process structurally identical JAN
JANTX or JANTXV devices from lots as a single intergral part number and segregate into specific part numbers at the
conclusion of group A testing. When devices are processed using the MIL-PRF-19500 standard flow, each part
number in the assembly lot must separately complete group A. When devices are processed using an alternate flow,
the initial group A may be performed on a sample of randomly selected devices from each assembly lot that
comprises the inspection lot through the use of a worst case or binning test. Each appropriate part number selected
from the initial group A shall complete a final group testing (A1, A2, and B1) by individual part number. Qualification
by extension may be granted for this specification by the if the qualifying activity determines it is structurally identical
to other qualified devices.
4.4.2 Group B inspection. Group B inspection shall be conducted in accordance with the conditions specified for
subgroup testing in table E-VIa (JANS) and table E-VIb (JAN, JANTX, and JANTXV) of MIL-PRF-19500, and as
follows. Electrical measurements (end-points) and delta requirements shall be in accordance with table I, subgroup II
herein. Samples for group B testing of JAN, JANTX, or JANTXV devices processed through group A alternate flow
shall be randomly selected from all appropriate part numbers represented in the inspection lot.
4.4.2.1 Group B inspection, table E-VIa (JANS) of MIL-PRF-19500.
Subgroup
Method Condition
B3
1056
Test condition B.
B3
1071
Fine leak: Condition G or H;
Gross leak: Condition C.
B3
2037
Bond strength: Test condition D. Sample used in decap internal visual design
verification may be used in bond strength and die shear. Sample is in units.
B4
High temperature isolation voltage test (see 4.5.2) and as follows: VISO = 150 V dc,
TA = +125°C, t = 24 hours minimum. n = 22, c = 0, small lot sample size n = 8, c = 0.
VCE = 10 V dc, IF = 20 mA dc, PT = 275 ±25 mW at TA = +25°C ±3°C (see figure 4),
B4
1037
ton = toff = 3 minutes minimum for 2,000 cycles. No heat sink or forced air cooling
directly on the device shall be permitted.
B5
1027
VCE = 10 V dc, TA = +100°C ±3°C for 96 hours, PT = 275 ±25 mW, IF = 20 mA dc
(see figure 4). Marking legibility requirements shall not apply.
B5
2037
(Al-Au die interconnects only), test condition A.
B6, B7
Not applicable.
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