MIL-PRF-19500-572 Semiconductor Device, Diode, Light Emitting, Types 1N6493, 1N6494, 1N6495, 1N6500, 1N6501, And 1N6502, Jan And JantxThis specification covers the performance requirements for red, yellow, and green light-emitting diodes \(LED\). Two levels of product assurance are provided for each device type as specified in MIL┬ûPRF┬û19500.

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MIL�PRF�19500/572C

3.4.1 Lead finish. Lead finish shall be solderable in accordance with MIL�PRF�19500, MIL�STD�750, and herein.

Where a choice of lead finish is desired, it shall be specified in the acquisition document (see 6.3).

3.5 Marking. Marking shall be in accordance with MIL�PRF�19500. Manufacturer's identification and date code

shall be marked on the devices. Initial container package marking shall be in accordance with MIL�PRF�19500.

3.6 Electrical performance characteristics. Unless otherwise specified herein, the electrical performance

characteristics are as specified in 1.3, 1.4, and table I herein.

3.7 Electrical test requirements. The electrical test requirements shall be as specified in table I herein.

3.8 Workmanship. Semiconductor devices shall be processed in such a manner as to be uniform in quality and

shall be free from other defects that will affect life, serviceability, or appearance.

4. VERIFICATION

4.1 Classification of inspections. The inspection requirements specified herein are classified as follows:

Qualification inspection (see 4.2).

Screening (see 4.3).

Conformance inspection (see 4.4, and tables I and II herein).

4.2 Qualification inspection. Qualification inspection shall be in accordance with MIL�PRF�19500 and as specified

herein.

4.2.1 Group E qualification. The group E inspections of table II herein shall be performed for qualification or

re-qualification only. In case qualification was awarded to a prior revision of the specification sheet that did not

require the performance of group E inspection, the tests specified in table II herein that were not performed in the

prior revision shall be performed on the first inspection lot of this revision to maintain qualification.

4.3 Screening (JANTXV and JANTX levels). Screening shall be in accordance with table E�IV of MIL�PRF�19500

and as specified herein. Specified electrical measurements shall be made in accordance with table I herein. Devices

that exceed the limits of table I herein shall not be acceptable.

Measurements

Screen

see table E�IV of

JANTX level

Method 1071 of MIL�STD�750, fine leak, test condition H (leak testing

30 minutes after pressurization is acceptable.)

Method 1071 of MIL�STD�750, gross leak, test condition C, except that

leak indicator fluid shall be maintained at +100�C �5�C.

9 and 10

Not applicable.

Subgroup 2 of table I herein.

IF = 35 mA dc; TA = +25�C, t = 168 hours.

Subgroup 2 of table I herein; ĆIV1 = �20 percent of initial readings.

ĆVF = �50 mV dc.