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MIL-PRF-19500-519 Light Emitting Diode, Red, Jedec Types Jan1N6092, Jantx1N6092 \(Diffused Lens\), Jan1N6609, Jantx1N6609 \(Clear Lens\), And Panel Mount Assembly, Types Janm19500/51901, Jantxm19500/51902 \(Diffused Lens\), Janm19500/51903 And Jantxm19500/51904 \(Clear Lens\)This specification covers the performance requirements for hermetically-sealed red discrete and panel mount light emitting diodes. Two levels of product assurance are provided for each device type as specified in MIL–PRF–19500.

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MIL­PRF­19500/519E
4.4.2 Group B inspection. Group B inspection shall be conducted in accordance with the conditions specified for
subgroup testing in table E­VIB of MIL­PRF­19500 and herein. Electrical measurements (end-points) shall be in
accordance with the inspections of table I, subgroup 2 herein.
Subgroup
Method
Conditions
Test condition A, except T(high) = +100°C (25 cycles); time at temperature
B2
1051
extremes 10 minutes minimum.
B2
1071
Fine leak: Test condition G or H (for condition H, leak testing 1 hour after
pressurization shall be acceptable).
Gross leak: Test condition A, D, E, or J except that leak indicator fluid shall be
maintained at +100°C ±5°C.
IF = 35 mA dc; TA = +25°C; t = 340 hours +72, ­24 hours (see 4.4.a).
B3
1027
4.4.3 Group C inspection. Group C inspection shall be conducted in accordance with the conditions specified for
subgroup testing in table E­VII of MIL­PRF­19500 and as follows. Electrical measurements (end-points) shall be in
accordance with the inspections of table I, subgroup 2 herein.
Subgroup
Method
Conditions
C2
1056
Test condition A.
C2
2036
Test condition E.
C2
1071
Fine leak: Test condition G or H (for condition H, leak testing 1 hour after
pressurization shall be acceptable).
Gross leak: Test condition A, D, E, or J except that leak indicator fluid shall be
maintained at +100°C ±5°C.
C3
2016
Non-operating; 1,500 G's; t = 0.5 ms; 5 blows in each orientation: X1, Y1, and Y2.
C3
2056
Non-operating.
C3
2006
Non-operating; 20,000 G's; X1, Y1, and Y2, one minute in each orientation.
IF = 35 mA dc; TA = +25°C, 1,000 hours.
C6
1026
Peak forward pulse current (transient); tP = 1 µs, pps = 300, total test time = 5 s,
C7
Iprt = 1.0 A (pk).
tP = 0.5 ms, PFM ≤ 120 mW, TA = +25°C, IP = 60 mA, 500 hours.
C8
4.5 Methods of inspection. Methods of inspection shall be as specified in the appropriate tables and as follows.
4.5.1 Axial luminous intensity. This measurement is made with a photometer.
7



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