MILPRF19500/519E
TABLE III. Group E inspections (all quality levels) for qualification only.
Quality conformance
Inspections
inspection sample size
Method
Conditions
Subgroup 1
45 devices, c = 0
Temperature cycling
1051
Test condition A, except that the hot
temperature shall be +100°C, +15°C / -0°C,
20 cycles.
Hermetic seal
1071
Fine leak
Gross leak
Electrical measurements
Subgroup 2
45 devices, c = 0
Intermittent operating life
1037
For all devices with organic material.
Electrical measurements
Subgroups 5 and 6
Not applicable
5. PACKAGING
5.1 Packaging. For acquisition purposes, the packaging requirements shall be as specified in the contract or order
(see 6.2). When packaging of materiel is to be performed by DoD or in-house contractor personnel, these personnel
need to contact the responsible packaging activity to ascertain packaging requirements. Packaging requirements are
maintained by the Inventory Control Point's packaging activities within the Military Service or Defense Agency, or
within the Military Service's system commands. Packaging data retrieval is available from the managing Military
Department's or Defense Agency's automated packaging files, CD-ROM products, or by contacting the responsible
packaging activity.
6. NOTES
(This section contains information of a general or explanatory nature that may be helpful, but is not mandatory. The
notes specified in MILPRF19500 are applicable to this specification.)
6.1 Intended use. Semiconductors conforming to this specification are intended for original equipment design
applications and logistic support of existing equipment.
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