MIL-PRF-19500-486 Coupler, Opto Electronic, Semiconductor Device, Solid State, Types 4N22, 4N22A, 4N23, 4N23A, 4N24, 4N24A, 4N22U, 4N23U, And 4N24U, Jan, Jantx, Jantxv, And JansThis specification covers the performance requirements for solid state optically coupled isolators in which a gallium aluminum arsenide diode light source is optically coupled to a silicon NPN phototransistor. Four levels of product assurance are provided for each type as specified in MIL-PRF-19500.

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MIL-PRF-19500/486H

3.4.1 Lead finish for 4N22, 4N22A, 4N23, 4N23A, 4N24, and 4N24A. Lead finish shall be solderable in

accordance with MIL-STD-750, MIL-PRF-19500, and herein. Where a choice of lead finish is desired, it shall be

specified in the acquisition document (see 6.2).

3.4.2 Lead finish for 4N22U, 4N23U, and 4N24U. Terminal pad shall be tungsten co-fired to the ceramic package.

Terminal pad finish shall be gold plated or solder dipped. Where a choice of lead finish is desired, it shall be

specified in the acquisition document (6.2).

3.4.3 Die shear. Die shear process control for eutectic alloyed die of less than 1.5 X 10-5 square inches of surface

area shall be in accordance with the requirements for small area die in method 2019 of MIL-STD-883. Die shear is

not required on the light emitting diode.

* 3.4.4 Moisture content. The internal moisture content of the device package shall not exceed 10,000 ppm

at +100�C.

3.5 Marking. Marking shall be in accordance with MIL-PRF-19500.

3.6 Electrical performance characteristics. Unless otherwise specified herein, the electrical performance

characteristics are as specified in 1.3, 1.4, and table I.

3.7 Electrical test requirements. The electrical test requirements shall be as specified in table I herein.

3.8 Workmanship. Semiconductor devices shall be processed in such a manner as to be uniform in quality and

shall be free from other defects that will affect life, serviceability, or appearance.

4. VERIFICATION

* 4.1 Classification of inspections. The inspection requirements specified herein are classified as follows:

a. Qualification inspection (see 4.2).

b. Screening (see 4.3).

c. Conformance inspection (see 4.4 and table I and table II).

4.2 Qualification inspection. Qualification inspection shall be in accordance with MIL-PRF-19500 and as specified

herein.

4.2.1 Group E qualification. Group E inspection shall be performed for qualification or re-qualification only. In

case qualification was awarded to a prior revision of the specification sheet that did not request the performance of

table II tests, the tests specified in table II herein shall be performed by the first inspection lot of this revision to

maintain qualification. Group E qualification by extension may be granted for this specification if the qualifying activity

determines it is structurally identical to other qualified devices.