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MIL-PRF-19500-521 Light Emitting Diode, Green, Jedec Types Jan1N6094, Jantx1N6094 \(Diffused Lens\), Jan1N6611, Jantx1N6611 \(Clear Lens\), And Panel Mount Assembly, Types Janm19500/52101, Jantxm19500/52102 \(Diffused Lens\), Janm19500/52103 And Jantxm19500/52104 \(Clear Lens\)This specification covers the performance requirements for hermetically-sealed green discrete and panel mount light emitting diodes. Two levels of product assurance are provided for each device type as specified in MIL–PRF–19500.

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MIL­PRF­19500/521E
4.4.2 Group B inspection. Group B inspection shall be conducted in accordance with the conditions specified for
subgroup testing in table E­VIB of MIL­PRF­19500 and herein. Electrical measurements (end-points) shall be in
accordance with the inspections of table I, subgroup 2 herein.
Subgroup
Method
Conditions
B2
1051
Test condition A, except T(high) = +100°C (25 cycles); time at temperature
extremes 10 minutes minimum.
B2
1071
Fine leak: Test condition G or H (for condition H, leak testing 1 hour after
pressurization shall be acceptable).
Gross leak: Test condition A, D, E, or J except that leak indicator fluid shall be
maintained at +100°C ±5°C.
B3
1027
IF = 35 mA dc; TA = +25°C; t = 340 hours +72, ­24 hours (see 4.4.a).
4.4.3 Group C inspection. Group C inspection shall be conducted in accordance with the conditions specified for
subgroup testing in table E­VII of MIL­PRF­19500 and as follows. Electrical measurements (end-points) shall be in
accordance with the inspections of table I, subgroup 2 herein.
Subgroup
Method
Conditions
C2
1056
Test condition A.
C2
2036
Test condition E.
C2
1071
Fine leak: Test condition G or H (for condition H, leak testing 1 hour after
pressurization shall be acceptable).
Gross leak: Test condition A, D, E, or J except that leak indicator fluid shall be
maintained at +100°C ±5°C.
C3
2016
Non-operating; 1,500 G's; t = 0.5 ms; 5 blows in each orientation: X1, Y1, and Y2.
C3
2056
Non-operating.
C3
2006
Non-operating; 20,000 G's; X1, Y1, and Y2, one minute in each orientation.
C6
1026
IF = 35 mA dc; TA = +25°C, 1,000 hours.
C7
Peak forward pulse current (transient); tP = 1 µs, pps = 300, total test time = 5 s,
Iprt = 1.0 A (pk).
C8
tP = 0.5 ms, PFM ≤ 120 mW, TA = +25°C, IP = 60 mA, 500 hours.
4.5 Methods of inspection. Methods of inspection shall be as specified in the appropriate tables and as follows.
4.5.1 Axial luminous intensity. This measurement is made with a photometer.
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